Inspecting the invisible with Baumer SWIR cameras

With the new SWIR cameras, Baumer is adding another high-performance product to the broad machine vision portfolio. The new CX.SWIR.XC cameras from Baumer offer a previously unattained precision level in inspection tasks in the infrared spectral range. The crucial factor for such high precision is the patented thermal de-sign of the Baumer CX.SWIR.XC cameras. It prevents defect pixels even before they come up. Together with static and dynamic defect pixel correction in the Baumer camera firmware, the image quality comes very close to that of silicon-based sensors. The new CX.SWIR.XC cameras acquire wavelengths ranging from 400 to 1700 nm and therefore can be deployed for tasks both the visible and non-visible light spectrum.

Innovative design prevents defect pixels

Due to technology, InGaAs sensors as used in modern SWIR cameras show significantly more defective pixels than silicon-based CMOS sensors. The sensor temperature must be as low as possible to reduce defect pixels to a minimum. Baumer responds to this challenge with SWIR cameras in innovative thermal design. The integrated cooling fin would dissipate heat to the outside. Further, there is also a housing-integrated cooling pipe for optional use. This cooling pipe utilizing compressed air or fluids would dissipate heat to the outside, right exactly where heat is produced - at sensor and lens. By doing so, cooling the critical points cuts down on the number of defect pixels and further speeds up thermal stabilization of the overall system. The camera is quickly ready for operation and reliably delivers extremely precise image data.

High-precision image data for demanding applications

The Baumer SWIR cameras are particularly ideal for applications in the semiconductor industry with wafer positioning, where high-precision image data and fast throughput rates are required. More application potential for the Baumer SWIR cameras is in the pharmaceutical and food industry in point level and object detection.