Compact laser micrometer for industrial applications
Micro-Epsilon: The new optoCONTROL 2520 laser micrometer with integrated controller has an extremely compact design. Operators can choose a maximum distance of 2 metres between transmitter and receiver. The measurement object can be placed anywhere within the light curtain that is projected between transmitter and receiver. The convenient Ethernet-based web interface simplifies operation, integration and remote access during the manufacturing process.
The optoCONTROL 2520 compact laser micrometer offers high accuracy and variable mounting distances between 100mm and 2m. The distance between measurement object and receiver can be freely selected and the measurement object can be placed at any position within the light curtain. The measuring range is 46mm. An intuitive web interface is used to perform set up and configuration. A real time measurement chart provides a convenient method of display. A variety of measurement values, such as single edges, diameter and centre axis, can be displayed or hidden in the chart at the user’s discretion. In addition, the system provides various averaging and filter methods, as well as statistics features. Available interfaces are Ethernet / EtherCAT and RS422. A video signal diagram is used for easy alignment and set up of measurements.
optoCONTROL 2520 is suitable for numerous applications in quality control and production. For example, the optical micrometer can measure diameters, edges and gaps on the target object, and up to eight segments can be measured and output simultaneously. The smallest detectable object diameter is 0.5mm, which means that IC pins, gaps, pin strips, etc in electronics production can be measured accurately. This new precision micrometer is also ideal for detecting large objects and for performing large distance measurements. The large measuring distance of up to 2m ensures flexible installation options for transmitter and receiver in production lines where space is limited. Any machine parts that may protrude into the measurement curtain can be masked.